| změnit na češtinu
Please switch off AdBlock for this webside to display it correctly (there are no ads here).

newAD2 - optical characterization software

Welcome newAD2 newAD2 newAD2gui Cluster Halt / Quit Input Data Model Parameters Settings Calculate Minimum Fit Evolution Abort / Finish Restore / Import Output Grapher Messages Modeling Structural parameters Yeh matrices Mueller matrices Functions Dispersion Models Empirical Constant Cauchy formula Sellmeier formula Elementary Vacuum Drude-Lorentz (DHO) Gaussian peak Voigt peak Gauss-Lorentz peak Tauc-Lorentz Truncated Lorentzian peak Broadened polynominal function Special Sum Multiply Bruggeman formula Advanced Crystalline silicon Universal dispersion models OTF2.1 OTF2.2 Regression method Tutorials Tutorial 1 Tutorial 2 Tutorial 3 Tutorial 4 Tutorial 5 References Install History Authors

CzechNanoLab project LM2023051

Advanced dispersion models

Model modelname Atributes
Crystalline silicon (c-Si)c-SiO, C, P, B