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Tutorial 1 - calculation of optical constants and other quantities
This tutorial shows how to calculate optical constants using the build-in dispersion model and how to model reflectance.
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Tutorial 2 - reflectance fit using the Sellmeier formula
This tutorial shows how to determine refractive index of SiO2 thin film on silicon wafer using the reflectance measurements.
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Tutorial 3 - fitting multiple measurements together
This tutorial shows how to combine and (fit together) different types of measurement (specifically reflectance and ellipsometry).
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Tutorial 4 - modelling of non-uniform samples
This tutorial shows how to introduce sample non-uniformity.