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newAD2 -
optical characterization software
References
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D. Franta, D. Nečas, L. Zajíčková,
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models,
Thin Solid Films 534 (2013) 432-441
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D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, J. Stuchlík, D. Chvostová,
Application of sum rule to the dispersion model of hydrogenated amorphous silicon,
Thin Solid Films 539 (2013) 233-244
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D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, J. Stuchlík,
Advanced modeling for optical characterization of amorphous hydrogenated silicon films,
Thin Solid Films 541 (2013) 12-16
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D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal,
Broadening of dielectric response and sum rule conservation,
Thin Solid Films 571 (2014) 496-501
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D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal,
Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen,
Thin Solid Films 571 (2014) 490-495
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D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal,
Dispersion model of two-phonon absorption: application to c-Si,
Optical Materials Express 4 (2014) 1641-1656
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D. Franta, D. Nečas, I. Ohlídal,
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia,
Applied Optics 54 (2015) 9108-9119
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D. Franta, D. Nečas, I. Ohlídal, A. Giglia,
Dispersion model for optical thin films applicable in wide spectral range,
in: Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V,
SPIE 9628 (2015) 96281U-1-12