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newAD2 - optical characterization software

References

  1. D. Franta, D. Nečas, L. Zajíčková, Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models, Thin Solid Films 534 (2013) 432-441
  2. D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, J. Stuchlík, D. Chvostová, Application of sum rule to the dispersion model of hydrogenated amorphous silicon, Thin Solid Films 539 (2013) 233-244
  3. D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, J. Stuchlík, Advanced modeling for optical characterization of amorphous hydrogenated silicon films, Thin Solid Films 541 (2013) 12-16
  4. D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, Broadening of dielectric response and sum rule conservation, Thin Solid Films 571 (2014) 496-501
  5. D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen, Thin Solid Films 571 (2014) 490-495
  6. D. Franta, D. Nečas, L. Zajíčková, I. Ohlídal, Dispersion model of two-phonon absorption: application to c-Si, Optical Materials Express 4 (2014) 1641-1656
  7. D. Franta, D. Nečas, I. Ohlídal, Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia, Applied Optics 54 (2015) 9108-9119
  8. D. Franta, D. Nečas, I. Ohlídal, A. Giglia, Dispersion model for optical thin films applicable in wide spectral range, in: Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, SPIE 9628 (2015) 96281U-1-12